Materials

    Characterization of:
  • ZnO
  • GaAs
  • Si
  • Nanowires
  • Plasmonics
  • Wide band gap

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PV

  • Improvement of solar cells yield
  • Validation of new technologies
  • Off-line quality control
  • Failure analysis

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GaN

  • Quality control of power devices
  • Characterization of LED
  • Counting of Threading Dislocations
  • Development of new devices

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