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Attolight workshop on semiconductor characterization

On August 29th, 2013, Attolight will give an introduction to Quantitative Cathodoluminescence (CL) during the event hosted by SIMTech, in Singapore. An overview of the applications demonstrating the method’s ability to probe optical properties at a nanoscale of different semiconductor structures will be presented, in particular the ability of CL to determine threading dislocation densities on GaN wafers for LED production. The power of CL to rapidly verify new production processes will also be demonstrated through an example in power electronics. Examples of CL used for failure analysis and on novel materials for semiconductor industry will also be given.

Swissnex Singapore is a sponsor of the event. Registration is free but compulsory.