All the power of a TEM & SEM in a benchtop electron microscope
Thanks to its 5 kV low voltage electron beam, images have up to 20x more contrast than conventional 100 kV TEM images. Learn more
Because of its high contrast, no sample staining is required. You reduce your sample preparation time. You observe samples in their native form. Learn more
Field emission gun (FEG), miniaturized electron optics and ion pumps. The best of Delong Instruments technology in one microscope. Learn more
The smart, simple and robust design of the LVEM5 lets you save on purchase, installation, training and operation. Learn more